Measurement of alloying elements by X-ray fluorescence spectrometry (XRF)

• Non destructive analysis of elements present in solid samples
  

• The sample is irradiated by an X-ray beam produced by a monochromatic X-ray tube. The atoms then get to an "excited electronic state". Back transition to a normal stable state gives rise to the emission of secondary X-rays which are characteristic of each contained element.

• A diaphram and a collimator are used to focalize secondary X-rays, and direct them to one of the selected crystals associated to the element to analyse. A dispersive optical system (i.e the crystal) is used to select each separate wavelength characteristic of the element to analyse.  A radiation detector then transforms the optical signal into an electrical signal. The electrical signal is then amplified and transformed through a computerized software into a concentation.
• As it is the case for Spark Emission Spectrometry, XRF spectrometry is not an absolute method and needs frequent calibrations, using “reference samples”.
  
• PECHINEY is a worldwide reknowned producer of such X.R.F reference samples